ALCANCES Y LIMITACIONES EN LA MEDICIÓN DE PELÍCULAS CON UN DIFRACTÓMETRO CONVENCIONAL: BRUKER D8 ADVANCE
DOI:
https://doi.org/10.36790/epistemus.v10i21.39Keywords:
Angulo rasante, películas delgadas, difractómetro convencionalAbstract
Las películas delgadas son capas de materiales con espesores que van desde algunos cuantos nanómetros hasta algunos micrómetros, dichas capas son creadas por técnicas tanto físicas como químicas. Para la caracterización estructural de los materiales cristalinos en forma de películas es indispensable la técnica de difracción de rayos X (DRX). El difractómetro indicado para hacer las mediciones debe de incluir un accesorio conocido como espejo Gobel. En el presente trabajo se realizaron mediciones sobre películas de: CdS, AgOH y CdCO3 utilizando un difractómetro convencional de polvos sin espejo Gobel, los resultados fueron favorables ya que se obtuvieron los patrones de difracción de los materiales, observándose una mejor definición en las películas de mayor espesor.
Downloads
References
L. García, A. M. Courrech, L. Zamora, A. López, T. Hernández, y J. Hernández. Recubrimientos de HfN y AlHfN fabricados por Sputtering. Memorias del XIX Congreso Internacional Anual de la SOMIM: 890, 2013.
M. Marciszko. A. Baczamanski, K. Wierzbanowski, M. Wróbel, C. Braham, J. P. Chopart, A. Lodini, J.Bonarski, N. Zazi. Application of multireflection grazing incidence method for stress measurements in polished Al-Mg ALLOY AND CrN coating. Applied Surface Science 266:256-267, 2013. DOI: https://doi.org/10.1016/j.apsusc.2012.12.005
M. B. Orduño. Síntesis y caracterización de películas delgadas de sulfuro de cadmio (CdS), preparadas bajo condición variable de reacción el método de deposición en baño químico (DbQ). Tesis profesional. Químico Biólogo, Univ. Sonora, pp. 22-27, 1998.
O. Toma, L. Ion, S. Iftimie, A. Radu, S. Antohe. Structural, morphological and optical properties of rf-Sputtered CdS thin films. Material and Design 100: 198-203, 2016. DOI: https://doi.org/10.1016/j.matdes.2016.03.117
P. Scherrer, Göttinger Nachrichten Gesell: Vol. 2, p 98, 1918.[6] J. M. Sasaki. Acta Crystallographica A-Foundation and Advances: Vol. 72, 385-390, 2016. DOI: https://doi.org/10.1107/S205327331600365X
Downloads
Published
How to Cite
Issue
Section
License
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
The magazine acquires the patrimonial rights of the articles only for diffusion without any purpose of profit, without diminishing the own rights of authorship.
The authors are the legitimate owners of the intellectual property rights of their respective articles, and in such quality, by sending their texts they express their desire to collaborate with the Epistemus Magazine, published biannually by the University of Sonora.
Therefore, freely, voluntarily and free of charge, once accepted the article for publication, they give their rights to the University of Sonora for the University of Sonora to edit, publish, distribute and make available through intranets, Internet or CD said work, without any limitation of form or time, as long as it is non-profit and with the express obligation to respect and mention the credit that corresponds to the authors in any use that is made of it.
It is understood that this authorization is not an assignment or transmission of any of your economic rights in favor of the said institution. The University of Sonora guarantees the right to reproduce the contribution by any means in which you are the author, subject to the credit being granted corresponding to the original publication of the contribution in Epistemus.
Unless otherwise indicated, all the contents of the electronic edition are distributed under a license for use and Creative Commons — Attribution-NonCommercial-ShareAlike 4.0 International — (CC BY-NC-SA 4.0) You can consult here the informative version and the legal text of the license. This circumstance must be expressly stated in this way when necessary.
The names and email addresses entered in this journal will be used exclusively for the purposes established in it and will not be provided to third parties or for their use for other purposes.
